Laser Reliability, Burn-in and Life-test, and Qualification Systems

Laser Reliability, Burn-in and Life-test, and Qualification Systems As active photonic devices become smaller and with increasing component integration into an application specific photonic integrate circuit, the cost of a device failure at final functional test increases dramatically. This increases the need to test active photonic integrated circuits (PIC) or devices with multiple lasers both at an earlier stage to qualify and lifetest the lasing properties during New Product Introduction but also to provide burn-in testing of mechanically complex devices during manufacture. Yelo's laser reliability, burn in and lifetest solutions are capable of testing devices such as - laser diodes laser bars/laser arrays VCSEL arrays, VCSEL bars Avalanche Photodiodes (APD) PIN Photodiodes VCSEL TO Headers, To-can Photonic integrated circuits including lasers, amplifiers, modulators, photodiodes and thermistors Silicon photonic devices Semiconductor Optical Amplifiers (SOA) miniDIL's Butterfly packages